Retention loss characteristics of localized charge-trapping devices

Eli Lusky, Yossi Shacham-Diamand, Assaf Shappir, Ilan Bloom, Guy Cohen, Boaz Eitan

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Article number1315384
Pages (from-to)527-530
Number of pages4
JournalIEEE International Reliability Physics Symposium Proceedings
Volume2004-January
Issue numberJanuary
DOIs
StatePublished - 2004
Event42nd Annual IEEE International Reliability Physics Symposium, IRPS 2004 - Phoenix, United States
Duration: 25 Apr 200429 Apr 2004

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