Original language | English |
---|---|
Article number | 1315384 |
Pages (from-to) | 527-530 |
Number of pages | 4 |
Journal | IEEE International Reliability Physics Symposium Proceedings |
Volume | 2004-January |
Issue number | January |
DOIs | |
State | Published - 2004 |
Event | 42nd Annual IEEE International Reliability Physics Symposium, IRPS 2004 - Phoenix, United States Duration: 25 Apr 2004 → 29 Apr 2004 |
Retention loss characteristics of localized charge-trapping devices
Eli Lusky, Yossi Shacham-Diamand, Assaf Shappir, Ilan Bloom, Guy Cohen, Boaz Eitan
Research output: Contribution to journal › Conference article › peer-review
12
Scopus
citations