Reflective interferometry for optical metamaterial phase measurements

Kevin O'Brien, N. D. Lanzillotti-Kimura, Haim Suchowski, Boubacar Kante, Yongshik Park, Xiaobo Yin, Xiang Zhang

Research output: Contribution to journalArticlepeer-review


The unambiguous determination of optical refractive indices of metamaterials is a challenging task for device applications and the study of new optical phenomena. We demonstrate here simple broadband phase measurements of metamaterials using spectrally and spatially resolved interferometry. We study the phase response of a π-shaped metamaterial known to be an analog to electromagnetically induced transparency. The measured broadband interferograms give the phase delay or advance produced by the metamaterial in a single measurement. The presented technique offers an effective way of characterizing optical metamaterials including nonlinear and gain-metamaterial systems.

Original languageEnglish
Pages (from-to)4089-4091
Number of pages3
JournalOptics Letters
Issue number19
StatePublished - 1 Oct 2012
Externally publishedYes


Dive into the research topics of 'Reflective interferometry for optical metamaterial phase measurements'. Together they form a unique fingerprint.

Cite this