TY - GEN
T1 - Re-configurable MMIC
T2 - 2005 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2005
AU - Vazokha, M.
AU - Solodky, S.
AU - Ben-Or, R.
AU - Kaplun, J.
AU - Ortenberg, I.
AU - Leibovitch, M.
AU - Shapira, Yoram
PY - 2005
Y1 - 2005
N2 - While today's MMIC chips suffer from lack of tuning ability, millimeter and microwave communication applications face a demand for very high MMIC performance. At the chip level this calls for wide band, high overall gain, return loss, output power, and low noise. The proposed concept of re-configurable MMIC (RMMIC) will reduce cost/performance of highly integrated circuits by providing tuning ability to the chip components. RMMIC is a traditional MMIC upgraded with special elements that allow adjusting the essential circuit parameters after the wafer manufacturing is finished. The circuit adjustment is realized at the wafer level and "survives" through the rest of the circuit lifetime with no additional power consumption.
AB - While today's MMIC chips suffer from lack of tuning ability, millimeter and microwave communication applications face a demand for very high MMIC performance. At the chip level this calls for wide band, high overall gain, return loss, output power, and low noise. The proposed concept of re-configurable MMIC (RMMIC) will reduce cost/performance of highly integrated circuits by providing tuning ability to the chip components. RMMIC is a traditional MMIC upgraded with special elements that allow adjusting the essential circuit parameters after the wafer manufacturing is finished. The circuit adjustment is realized at the wafer level and "survives" through the rest of the circuit lifetime with no additional power consumption.
KW - Re-configurable MMIC
KW - Tunable capacitor
UR - http://www.scopus.com/inward/record.url?scp=84887388032&partnerID=8YFLogxK
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AN - SCOPUS:84887388032
SN - 1893580067
SN - 9781893580060
T3 - 2005 International Conference on Compound Semiconductor Manufacturing Technology
BT - 2005 International Conference on Compound Semiconductor Manufacturing Technology
Y2 - 11 April 2005 through 14 April 2005
ER -