Radiation-hardening methodologies for flash ADC

Umberto Gatti; Cristiano Calligaro; Evgeny Pikhay; Yakov Roizin

doi:10.1007/s10470-015-0627-7

Radiation-hardening methodologies for flash ADC

Umberto Gatti, Cristiano Calligaro, Evgeny Pikhay, Yakov Roizin

Research output: Contribution to journal › Article › peer-review

Abstract

This work presents a rad-hard 4-bit 10 MHz Flash ADC for space applications. The converter has been developed using rad-hardened techniques at architecture, circuit and layout levels. The design takes into account the different effects of the radiation that could damage the circuits in harsh environments. The ADC has been integrated in a standard CMOS 0.18-μm technology by TowerJazz. The prototype has been tested with a custom methodology and showed a Total Dose immunity up to 300 krad (Si).

Original language	English
Pages (from-to)	141-154
Number of pages	14
Journal	Analog Integrated Circuits and Signal Processing
Volume	87
Issue number	2
DOIs	https://doi.org/10.1007/s10470-015-0627-7
State	Published - 1 May 2016
Externally published	Yes

Keywords

ADC
Data-converters
Radiation hardening by design
SEE
TID

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10.1007/s10470-015-0627-7

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AB - This work presents a rad-hard 4-bit 10 MHz Flash ADC for space applications. The converter has been developed using rad-hardened techniques at architecture, circuit and layout levels. The design takes into account the different effects of the radiation that could damage the circuits in harsh environments. The ADC has been integrated in a standard CMOS 0.18-μm technology by TowerJazz. The prototype has been tested with a custom methodology and showed a Total Dose immunity up to 300 krad (Si).

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Radiation-hardening methodologies for flash ADC

Abstract

Keywords

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