Quantum-Enhanced Microscopy Using Electron Number Pulses

Ethan Nussinson, Shiran Even-Haim, Rotem Elimelech, Ron Ruimy, Yonatan Israel, Ido Kaminer*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose a quantum phase estimation protocol in electron microscopy and holography, breaking the shot-noise limit despite the intrinsic Poisson-statistics of electron sources. This surprising capability is enabled by nondestructive measurements heralding number-state electron pulses.

Original languageEnglish
Title of host publication2024 Conference on Lasers and Electro-Optics, CLEO 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171395
StatePublished - 2024
Event2024 Conference on Lasers and Electro-Optics, CLEO 2024 - Charlotte, United States
Duration: 7 May 202410 May 2024

Publication series

Name2024 Conference on Lasers and Electro-Optics, CLEO 2024

Conference

Conference2024 Conference on Lasers and Electro-Optics, CLEO 2024
Country/TerritoryUnited States
CityCharlotte
Period7/05/2410/05/24

Keywords

  • Electro-optical waveguides
  • Electron microscopy
  • Electron sources
  • Holography
  • Lasers and electrooptics
  • Measurement by laser beam
  • Phase estimation
  • Protocols
  • Pulse measurements

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