Pudenz antisiphon device tear as a cause of shunt malfunction

Robert H. Pudenz*, S. Constantini

*Corresponding author for this work

Research output: Contribution to journalLetterpeer-review

Original languageEnglish
Pages (from-to)117
Number of pages1
JournalChild's Nervous System
Volume6
Issue number3
DOIs
StatePublished - May 1990
Externally publishedYes

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