Proximity-effect enhancement induced by roughness of the superconductor-normal-metal interface

R. Mints, I. Snapiro

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

Critical-temperature reduction (Formula presented) is considered for a thin film of a superconductor (S) with a rough surface covered by a thick layer of a normal metal (N). The value of (Formula presented) induced by the roughness of the SN interface can be much higher than (Formula presented) for a film with a plain surface if the superconductor is extremely anisotropic.

Original languageEnglish
Pages (from-to)10318-10319
Number of pages2
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume57
Issue number17
DOIs
StatePublished - 1998

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