Protection of silicon wafers from alkali contamination during high-temperature processing using electric field

M. Beregovsky*, A. Klyuch, Y. Raskin, Y. Zinman, Y. Shacham-Diamand, B. E. Deal

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Protection of silicon wafers from alkali contamination during high-temperature processing using electric field'. Together they form a unique fingerprint.

Keyphrases

Material Science

Engineering

Chemistry

Earth and Planetary Sciences