Profiling of deep traps in silicon oxide-nitride-oxide structures

M. Naich*, G. Rosenman, Ya Roizin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Fingerprint

Dive into the research topics of 'Profiling of deep traps in silicon oxide-nitride-oxide structures'. Together they form a unique fingerprint.

Chemistry

Engineering & Materials Science

Physics & Astronomy