Probing the intrinsic and extrinsic origins of piezoelectricity in lead zirconate titanate single crystals

Nan Zhang, Semën Gorfman*, Hyeokmin Choe, Tikhon Vergentev, Vadim Dyadkin, Hiroko Yokota, Dmitry Chernyshov, Bixia Wang, Anthony Michael Glazer, Wei Ren, Zuo Guang Ye

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

The physical origin of the piezoelectric effect has been the focus of much research work. While it is commonly accepted that the origins of piezoelectricity may be intrinsic (related to the change of lattice parameters) and extrinsic (related to the movement of domain walls), their separation is often a challenging experimental task. Here in situ high-resolution synchrotron X-ray diffraction has been combined with a new data analysis technique to characterize the change of the lattice parameters and domain microstructure of a PbZr1-xTixO3 (x = 0.45) crystal under an external electric field. It is shown how ‘effective piezoelectric coefficients’ evolve upon the transition from purely ‘intrinsic’ effects to ‘extrinsic’ ones due to domain-wall motion. This technique and corresponding data analysis can be applied to broader classes of materials and provide important insights into the microscopic origin of their physical properties.

Original languageEnglish
Pages (from-to)1396-1403
Number of pages8
JournalJournal of Applied Crystallography
Volume51
Issue number5
DOIs
StatePublished - Oct 2018

Funding

FundersFunder number
United States Office of Naval Research
Office of Naval ResearchN00014-16-13106, N00014-12-1-1045
Natural Sciences and Engineering Research Council of Canada203773
Japan Society for the Promotion of Science17K05489
National Natural Science Foundation of China61604123
Bundesministerium für Bildung und Forschung05K13PSA
Fundamental Research Funds for the Central Universities

    Keywords

    • Ferroelectricity
    • In situ X-ray diffraction
    • Piezoelectricity

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