Probing porosity in metals by electrical conductivity: Nanoscale experiments and multiscale simulations

Keyphrases

• Microstructure 100%
• Simulation Experiment 100%
• Electrical Conductivity 100%
• Porosity 100%
• Multiscale Simulation 100%
• Material System 100%
• Effective Electrical Properties 100%
• Pore Volume Fraction 100%
• Modeling Approach 50%
• Well-defined 50%
• 4-point 50%
• Quasi-one-dimensional 50%
• Sensitivity Analysis 50%
• Non-destructive 50%
• Electrical Characterization 50%
• Pore Shape 50%
• Analytical Techniques 50%
• Electrical Measurements 50%
• CuO Thin Films 50%
• Micropore 50%
• Homogenization Scheme 50%
• Conductivity Change 50%
• Focused Ion Beam Milling 50%
• Computational Homogenization 50%
• Defect Evolution 50%
• Pore Array 50%

Engineering

• Microstructure 100%
• Electrical Conductivity 100%
• Nanoscale 100%
• Multiscale 100%
• Porosity 100%
• Material System 100%
• Applicability 50%
• Simulation Result 50%
• Defects 50%
• Thin Films 50%
• One Dimensional 50%
• Focused Ion Beam 50%
• Microscale 50%
• Electrical Measurement 50%
• Probe Point 50%
• Computational Homogenisation 50%
• Pore Shape 50%

Material Science

• Electrical Conductivity 100%
• Volume Fraction 100%
• Pore Volume 100%
• Thin Films 50%
• Focused Ion Beam 50%
• Analytical Method 50%
• Homogenization 50%