Probing nanoscale optical fields and phase-shaping electron beams by inelastic electron-light scattering

Armin Feist, Thomas Rittmann, Tyler Harvey, Katharina E. Priebe, Christopher Rathje, Ofer Kfir, Jan Wilke Henke, Sergey V. Yalunin, Sascha Schäfer, Claus Ropers

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Ultrafast transmission electron microscopy (UTEM) is a powerful tool to study the dynamics of nanoscale systems, combining the versatile imaging, diffraction and spectroscopy capabilities of state-of-the-art TEM with femtosecond temporal resolution of a laser pump/electron probe scheme [1,2]. In particular, inelastic scattering between a free electron pulse and strong optical near fields [3,4] (Fig.1a) allows for a coherent manipulation of the electron quantum state. In this mechanism, the optical field imprints a sinusoidal phase modulation on the electron wave function [4], which manifests in a comb of photon sidebands in the kinetic energy distribution (Fig.1b) and - by energy-filtering - enables photon-induced near-field electron microscopy (PINEM) [3].

Original languageEnglish
Title of host publicationEuropean Quantum Electronics Conference, EQEC_2019
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781728104690
StatePublished - 2019
Externally publishedYes
EventEuropean Quantum Electronics Conference, EQEC_2019 - Munich, United Kingdom
Duration: 23 Jun 201927 Jun 2019

Publication series

NameOptics InfoBase Conference Papers
VolumePart F143-EQEC 2019
ISSN (Electronic)2162-2701

Conference

ConferenceEuropean Quantum Electronics Conference, EQEC_2019
Country/TerritoryUnited Kingdom
CityMunich
Period23/06/1927/06/19

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