TY - GEN
T1 - Probing nanoscale optical fields and phase-shaping electron beams by inelastic electron-light scattering
AU - Feist, Armin
AU - Rittmann, Thomas
AU - Harvey, Tyler
AU - Priebe, Katharina E.
AU - Rathje, Christopher
AU - Kfir, Ofer
AU - Henke, Jan Wilke
AU - Yalunin, Sergey V.
AU - Schäfer, Sascha
AU - Ropers, Claus
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/6
Y1 - 2019/6
N2 - Ultrafast transmission electron microscopy (UTEM) is a powerful tool to study the dynamics of nanoscale systems, combining the versatile imaging, diffraction and spectroscopy capabilities of state-of-the-art TEM with femtosecond temporal resolution of a laser pump/electron probe scheme [1,2]. In particular, inelastic scattering between a free electron pulse and strong optical near fields [3,4] (Fig.1a) allows for a coherent manipulation of the electron quantum state. In this mechanism, the optical field imprints a sinusoidal phase modulation on the electron wave function [4], which manifests in a comb of photon sidebands in the kinetic energy distribution (Fig.1b) and - by energy-filtering - enables photon-induced near-field electron microscopy (PINEM) [3].
AB - Ultrafast transmission electron microscopy (UTEM) is a powerful tool to study the dynamics of nanoscale systems, combining the versatile imaging, diffraction and spectroscopy capabilities of state-of-the-art TEM with femtosecond temporal resolution of a laser pump/electron probe scheme [1,2]. In particular, inelastic scattering between a free electron pulse and strong optical near fields [3,4] (Fig.1a) allows for a coherent manipulation of the electron quantum state. In this mechanism, the optical field imprints a sinusoidal phase modulation on the electron wave function [4], which manifests in a comb of photon sidebands in the kinetic energy distribution (Fig.1b) and - by energy-filtering - enables photon-induced near-field electron microscopy (PINEM) [3].
UR - http://www.scopus.com/inward/record.url?scp=85074633075&partnerID=8YFLogxK
U2 - 10.1109/CLEOE-EQEC.2019.8872437
DO - 10.1109/CLEOE-EQEC.2019.8872437
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AN - SCOPUS:85074633075
T3 - 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
BT - 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 23 June 2019 through 27 June 2019
ER -