Principles of kelvin probe force microscopy

Th Glatzel, M. Ch Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high lateral and energy resolution can be realized.

Original languageEnglish
Title of host publicationScanning Probe Microscopy
PublisherSpringer New York
Pages113-131
Number of pages19
Volume2
ISBN (Print)0387286675, 9780387286679
DOIs
StatePublished - 2007

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