Principles of kelvin probe force microscopy

Th Glatzel; M. Ch Lux-Steiner; E. Strassburg; A. Boag; Y. Rosenwaks

doi:10.1007/978-0-387-28668-6_5

Principles of kelvin probe force microscopy

Th Glatzel, M. Ch Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

38 Scopus citations

Abstract

In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high lateral and energy resolution can be realized.

Original language	English
Title of host publication	Scanning Probe Microscopy
Publisher	Springer New York
Pages	113-131
Number of pages	19
Volume	2
ISBN (Print)	0387286675, 9780387286679
DOIs	https://doi.org/10.1007/978-0-387-28668-6_5
State	Published - 2007

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10.1007/978-0-387-28668-6_5

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abstract = "In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high lateral and energy resolution can be realized.",

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Principles of kelvin probe force microscopy

Abstract

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