TY - JOUR
T1 - Plasma-guided Compton source
AU - Meir, Talia
AU - Cohen, Itamar
AU - Tangtartharakul, Kavin
AU - Cohen, Tamir
AU - Fraenkel, Moshe
AU - Arefiev, Alexey V.
AU - Pomerantz, Ishay
N1 - Publisher Copyright:
© 2024 American Physical Society.
PY - 2024/10
Y1 - 2024/10
N2 - We investigated numerically the emission properties of an x-ray source based on direct laser acceleration of electrons interacting with an intense counterpropagating laser pulse. The source was realized by irradiating from both sides a high atomic number plasma-plume target. The resulting x-ray beam was analyzed through three-dimensional particle-in-cell simulations for its spectral content, source size, angular divergence, and temporal structure. For simulated experiments in which the total laser-pulse energy was 1.5 J, we obtained a peak brightness of approximately 1022(smrad2mm20.1%BW)-1 of x-ray photons peaking at an energy of 25 keV. The results and their competitiveness in applications are discussed and compared with other laser-based x-ray generation methods.
AB - We investigated numerically the emission properties of an x-ray source based on direct laser acceleration of electrons interacting with an intense counterpropagating laser pulse. The source was realized by irradiating from both sides a high atomic number plasma-plume target. The resulting x-ray beam was analyzed through three-dimensional particle-in-cell simulations for its spectral content, source size, angular divergence, and temporal structure. For simulated experiments in which the total laser-pulse energy was 1.5 J, we obtained a peak brightness of approximately 1022(smrad2mm20.1%BW)-1 of x-ray photons peaking at an energy of 25 keV. The results and their competitiveness in applications are discussed and compared with other laser-based x-ray generation methods.
UR - http://www.scopus.com/inward/record.url?scp=85205966490&partnerID=8YFLogxK
U2 - 10.1103/PhysRevApplied.22.044004
DO - 10.1103/PhysRevApplied.22.044004
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AN - SCOPUS:85205966490
SN - 2331-7019
VL - 22
JO - Physical Review Applied
JF - Physical Review Applied
IS - 4
M1 - 044004
ER -