Abstract
A physical and electrical evaluation of the feasibility of planarization by means of composite films has been carried out. The use of even a very thin spin-on film underneath a conventional LPCVD PSG oxide film significantly improves the final topography. The electrical properties of the undoped PSG film are consistent with use in CMOS VLSI technologies.
Original language | English |
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Title of host publication | Digest of Technical Papers - Symposium on VLSI Technology |
Publisher | Business Cent for Academic Soc Japan |
Pages | 52-53 |
Number of pages | 2 |
ISBN (Print) | 4930813093 |
State | Published - 1985 |
Externally published | Yes |
Publication series
Name | Digest of Technical Papers - Symposium on VLSI Technology |
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ISSN (Print) | 0743-1562 |