Oxidation and thermal stability of thin film copper layers
- Y. Shacham-Diamand*
- , J. Li
- , J. O. Olowlafe
- , S. Russel
- , Y. Tamou
- , J. W. Mayer
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2
Scopus
citations