TY - JOUR
T1 - Outlier Detection for Robust Multi-Dimensional Scaling
AU - Blouvshtein, Leonid
AU - Cohen-Or, Daniel
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2019/9/1
Y1 - 2019/9/1
N2 - Multi-dimensional scaling (MDS) plays a central role in data-exploration, dimensionality reduction and visualization. State-of-the-art MDS algorithms are not robust to outliers, yielding significant errors in the embedding even when only a handful of outliers are present. In this paper, we introduce a technique to detect and filter outliers based on geometric reasoning. We test the validity of triangles formed by three points, and mark a triangle as broken if its triangle inequality does not hold. The premise of our work is that unlike inliers, outlier distances tend to break many triangles. Our method is tested and its performance is evaluated on various datasets and distributions of outliers. We demonstrate that for a reasonable amount of outliers, e.g., under 20 percent, our method is effective, and leads to a high embedding quality.
AB - Multi-dimensional scaling (MDS) plays a central role in data-exploration, dimensionality reduction and visualization. State-of-the-art MDS algorithms are not robust to outliers, yielding significant errors in the embedding even when only a handful of outliers are present. In this paper, we introduce a technique to detect and filter outliers based on geometric reasoning. We test the validity of triangles formed by three points, and mark a triangle as broken if its triangle inequality does not hold. The premise of our work is that unlike inliers, outlier distances tend to break many triangles. Our method is tested and its performance is evaluated on various datasets and distributions of outliers. We demonstrate that for a reasonable amount of outliers, e.g., under 20 percent, our method is effective, and leads to a high embedding quality.
KW - Multidimensional scaling
KW - data exploration
KW - data visualization
KW - embedding
KW - outliers
KW - robust
UR - http://www.scopus.com/inward/record.url?scp=85049341657&partnerID=8YFLogxK
U2 - 10.1109/TPAMI.2018.2851513
DO - 10.1109/TPAMI.2018.2851513
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AN - SCOPUS:85049341657
SN - 0162-8828
VL - 41
SP - 2273
EP - 2279
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
JF - IEEE Transactions on Pattern Analysis and Machine Intelligence
IS - 9
ER -