Optimization method for acquiring high resolution mapping of elastic moduli

Doron Shilo*, Yaniv Ganor

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Recently, a new technique has been developed, which allows quantitative nanoscale mapping of elastic moduli by means of a hybrid nanoindentation and force modulation instrument. We introduce a procedure for finding the experimental parameters that provide an optimal modulus contrast. Application of the procedure on three different material systems demonstrated the technique's capability to resolve between regions with elastic moduli as close as 5%. Thus, the improved modulus mapping procedure can be applied not only to composite materials but also to many multi-phase and multi-domain material systems.

Original languageEnglish
Title of host publicationProceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
Pages1880-1887
Number of pages8
StatePublished - 2006
Externally publishedYes
EventSEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006 - Saint Louis, MO, United States
Duration: 4 Jun 20067 Jun 2006

Publication series

NameProceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
Volume4

Conference

ConferenceSEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
Country/TerritoryUnited States
CitySaint Louis, MO
Period4/06/067/06/06

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