Optical scattering of reflected and guided laser beam in hollow waveguides for infrared energy transmission

Reuben Dahan, Jacob Dror, A. Inberg, Nathan I. Croitoru

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Surface roughness of sections of hollow waveguides is examined by measuring the backscattering reflection and using the total integral scattering (TIS) method. The iodination of silver was found as the main factor affecting the surface roughness. The AgI layer thickness also affects an interference phenomena as a function of wavelength.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages391-398
Number of pages8
StatePublished - 1995
Event9th Meeting on Optical Engineering in Israel - Tel-Aviv, Isr
Duration: 24 Oct 199426 Oct 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2426
ISSN (Print)0277-786X

Conference

Conference9th Meeting on Optical Engineering in Israel
CityTel-Aviv, Isr
Period24/10/9426/10/94

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