Abstract
Surface roughness of sections of hollow waveguides is examined by measuring the backscattering reflection and using the total integral scattering (TIS) method. The iodination of silver was found as the main factor affecting the surface roughness. The AgI layer thickness also affects an interference phenomena as a function of wavelength.
Original language | English |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Pages | 391-398 |
Number of pages | 8 |
State | Published - 1995 |
Event | 9th Meeting on Optical Engineering in Israel - Tel-Aviv, Isr Duration: 24 Oct 1994 → 26 Oct 1994 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 2426 |
ISSN (Print) | 0277-786X |
Conference
Conference | 9th Meeting on Optical Engineering in Israel |
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City | Tel-Aviv, Isr |
Period | 24/10/94 → 26/10/94 |