Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II: 1-6 February 2020, San Francisco, California, United States

SPIE

Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II: 1-6 February 2020, San Francisco, California, United States

SPIE

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	proceedings of SPIE
Place of Publication	Bellingham, Washington
Publisher	SPIE
ISBN (Print)	9781510633551, 9781510633568, 1510633553
State	Published - 2020

Publication series

Name	Proceedings of SPIE. 5200
Volume	volume 11296

Keywords

QUANTENINTERFEROMETRIE (QUANTENTHEORIE)
METROLOGIE, MASS- UND GEWICHTSSYSTEME
INTRICATION QUANTIQUE
ENTANGLEMENT (QUANTUM THEORY)
OPTICAL MEASURING METHODS (PHYSICS)
OPTISCHE MESSMETHODEN (PHYSIK)
METROLOGY, WEIGHTS AND MEASURES
QUANTUM INTERFEROMETRY (QUANTUM THEORY)
INTERFÉROMÉTRIE QUANTIQUE (THÉORIE QUANTIQUE)
VERSCHRÄNKUNG (QUANTENTHEORIE)
WELLENPAKETE (QUANTENTHEORIE)
PAQUETS D'ONDES (THÉORIE QUANTIQUE)
WAVE PACKETS (QUANTUM THEORY)
MÉTHODES DE MESURE OPTIQUES (PHYSIQUE)
MÉTROLOGIE, POIDS ET MESURES

Cite this

@inproceedings{5a833114763547d5ad055939430a54d0,

title = "Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II: 1-6 February 2020, San Francisco, California, United States",

keywords = "QUANTENINTERFEROMETRIE (QUANTENTHEORIE), METROLOGIE, MASS- UND GEWICHTSSYSTEME, INTRICATION QUANTIQUE, ENTANGLEMENT (QUANTUM THEORY), OPTICAL MEASURING METHODS (PHYSICS), OPTISCHE MESSMETHODEN (PHYSIK), METROLOGY, WEIGHTS AND MEASURES, QUANTUM INTERFEROMETRY (QUANTUM THEORY), INTERF{\'E}ROM{\'E}TRIE QUANTIQUE (TH{\'E}ORIE QUANTIQUE), VERSCHR{\"A}NKUNG (QUANTENTHEORIE), WELLENPAKETE (QUANTENTHEORIE), PAQUETS D'ONDES (TH{\'E}ORIE QUANTIQUE), WAVE PACKETS (QUANTUM THEORY), M{\'E}THODES DE MESURE OPTIQUES (PHYSIQUE), M{\'E}TROLOGIE, POIDS ET MESURES",

author = "SPIE and Shahriar, {Selim M} and Jacob Scheuer",

year = "2020",

language = "אנגלית",

isbn = "9781510633551",

series = "Proceedings of SPIE. 5200",

publisher = "SPIE",

booktitle = "proceedings of SPIE",

address = "ארצות הברית",

}

TY - GEN

T1 - Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II

T2 - 1-6 February 2020, San Francisco, California, United States

AU - SPIE

AU - Shahriar, Selim M

AU - Scheuer, Jacob

PY - 2020

Y1 - 2020

KW - QUANTENINTERFEROMETRIE (QUANTENTHEORIE)

KW - METROLOGIE, MASS- UND GEWICHTSSYSTEME

KW - INTRICATION QUANTIQUE

KW - ENTANGLEMENT (QUANTUM THEORY)

KW - OPTICAL MEASURING METHODS (PHYSICS)

KW - OPTISCHE MESSMETHODEN (PHYSIK)

KW - METROLOGY, WEIGHTS AND MEASURES

KW - QUANTUM INTERFEROMETRY (QUANTUM THEORY)

KW - INTERFÉROMÉTRIE QUANTIQUE (THÉORIE QUANTIQUE)

KW - VERSCHRÄNKUNG (QUANTENTHEORIE)

KW - WELLENPAKETE (QUANTENTHEORIE)

KW - PAQUETS D'ONDES (THÉORIE QUANTIQUE)

KW - WAVE PACKETS (QUANTUM THEORY)

KW - MÉTHODES DE MESURE OPTIQUES (PHYSIQUE)

KW - MÉTROLOGIE, POIDS ET MESURES

M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???

SN - 9781510633551

SN - 9781510633568

SN - 1510633553

T3 - Proceedings of SPIE. 5200

BT - proceedings of SPIE

PB - SPIE

CY - Bellingham, Washington

ER -