Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology: 2-7 February 2019, San Francisco, California, United States

SPIE

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publicationSPIE proceedings
Place of PublicationBellingham, Washington
PublisherSPIE
ISBN (Print)9781510625105, 1510625100, 9781510625112
StatePublished - 2019

Publication series

NameProceedings of SPIE. 5200
Volumevolume 10934

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