Optical in-situ analysis of secondary reflectors in solar tower plants

A. Timinger; T. Smith; M. Walther; W. Spirkl; A. Kribus; H. Ries; P. Doron

doi:10.1051/jp4:1999318

Optical in-situ analysis of secondary reflectors in solar tower plants

A. Timinger^*, T. Smith, M. Walther, W. Spirkl, A. Kribus, H. Ries, P. Doron

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

Abstract

An optical measurement for radiation concentrators is proposed. A Lambertian light source is placed in the exit aperture of the concentrator. By taking pictures of the concentrator as seen from a remote location one gets the transmission patterns which carry the information of transmission with the four-dimensional resolution of the phase space of geometric optics. By matching ray tracing simulations to the measurement, one can achieve detailed and accurate information about the geometry of the concentrator. The reflectivity can be inferred by very simple means with 2% accuracy. This method has the potential to provide a handy tool to get automatically all optical information about a real size concentrator in situ.

Original language	English
Pages (from-to)	Pr3-117 - Pr3-122
Journal	Journal De Physique. IV : JP
Volume	9
Issue number	3
DOIs	https://doi.org/10.1051/jp4:1999318
State	Published - 1999
Externally published	Yes
Event	Proceedings of the 1998 9th SolarPaces International Symposium on Solar Thermal Concentrating Technologies,STCT 9 - Font-Romeu Duration: 22 Jun 1998 → 26 Jun 1998

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title = "Optical in-situ analysis of secondary reflectors in solar tower plants",

abstract = "An optical measurement for radiation concentrators is proposed. A Lambertian light source is placed in the exit aperture of the concentrator. By taking pictures of the concentrator as seen from a remote location one gets the transmission patterns which carry the information of transmission with the four-dimensional resolution of the phase space of geometric optics. By matching ray tracing simulations to the measurement, one can achieve detailed and accurate information about the geometry of the concentrator. The reflectivity can be inferred by very simple means with 2% accuracy. This method has the potential to provide a handy tool to get automatically all optical information about a real size concentrator in situ.",

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year = "1999",

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journal = "Journal De Physique. IV : JP",

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note = "Proceedings of the 1998 9th SolarPaces International Symposium on Solar Thermal Concentrating Technologies,STCT 9 ; Conference date: 22-06-1998 Through 26-06-1998",

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T1 - Optical in-situ analysis of secondary reflectors in solar tower plants

AU - Timinger, A.

AU - Smith, T.

AU - Walther, M.

AU - Spirkl, W.

AU - Kribus, A.

AU - Ries, H.

AU - Doron, P.

PY - 1999

Y1 - 1999

N2 - An optical measurement for radiation concentrators is proposed. A Lambertian light source is placed in the exit aperture of the concentrator. By taking pictures of the concentrator as seen from a remote location one gets the transmission patterns which carry the information of transmission with the four-dimensional resolution of the phase space of geometric optics. By matching ray tracing simulations to the measurement, one can achieve detailed and accurate information about the geometry of the concentrator. The reflectivity can be inferred by very simple means with 2% accuracy. This method has the potential to provide a handy tool to get automatically all optical information about a real size concentrator in situ.

AB - An optical measurement for radiation concentrators is proposed. A Lambertian light source is placed in the exit aperture of the concentrator. By taking pictures of the concentrator as seen from a remote location one gets the transmission patterns which carry the information of transmission with the four-dimensional resolution of the phase space of geometric optics. By matching ray tracing simulations to the measurement, one can achieve detailed and accurate information about the geometry of the concentrator. The reflectivity can be inferred by very simple means with 2% accuracy. This method has the potential to provide a handy tool to get automatically all optical information about a real size concentrator in situ.

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SP - Pr3-117 - Pr3-122

JO - Journal De Physique. IV : JP

JF - Journal De Physique. IV : JP

IS - 3

T2 - Proceedings of the 1998 9th SolarPaces International Symposium on Solar Thermal Concentrating Technologies,STCT 9

Y2 - 22 June 1998 through 26 June 1998

ER -

Optical in-situ analysis of secondary reflectors in solar tower plants

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