On the mechanism of annealing effect in electrical resistivity of sub-100 nm Ag (1% W) films

E. Glickman*, A. Inberg, V. Bogush, G. Aviram, N. Croitoru, Y. Shacham-Diamand

*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

14 Scopus citations

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Engineering

Material Science

Earth and Planetary Sciences

Chemical Engineering