Observation of Andreev-Saint-James reflections in nano-scale planar superconductor to ferromagnet contacts

S. Hacohen-Gourgy, B. Almog, G. Deutscher

Research output: Contribution to journalArticlepeer-review

Abstract

We fabricated nanoscale ferromagnetic (F) Nickel/superconducting (S) indium junctions which show that spin polarization effects on the contact conductance can be observed in a planar geometry. The data demonstrate that the Andreev-Saint-James [Sov. Phys. JETP 19, 1228 (1964) and J. Phys. (Paris) 25, 899 (1964)] electron-hole reflections at the FS interface, which are sensitive to the polarization of the F side, dominate the conductance of the contact at low bias. The simplicity of fabrication makes these junctions appealing for use in multiterminal SF structures.

Original languageEnglish
Article number152502
JournalApplied Physics Letters
Volume92
Issue number15
DOIs
StatePublished - 2008

Fingerprint

Dive into the research topics of 'Observation of Andreev-Saint-James reflections in nano-scale planar superconductor to ferromagnet contacts'. Together they form a unique fingerprint.

Cite this