Nucleation, growth and size-distribution of Ge islands on Si(001): in situ STM studies

Ilan Goldfarb, J.H.G. Owen, P.T. Hayden, K. Miki , G.A.D. Briggs

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageAmerican English
Title of host publicationicroscopy of semiconducting materials 1997 :$bproceedings of the Royal Microscopical Society Conference held at Oxford University, 7-10 April 1997
Number of pages4
StatePublished - 1997

Cite this