Novel method for debug of electrostatic discharge protection in VLSI circuits

Keyphrases

• Current Measurement 50%
• Debugging 100%
• Electrostatic Discharge (ESD) Protection 100%
• Emulation 50%
• Failure Analysis 50%
• Failure Cause 50%
• Low Energy 50%
• Non-destructive 50%
• On-die 50%
• Protection Method 50%
• VLSI Circuits 100%
• Voltage Measurement 50%

Engineering

• Current Measurement 50%
• Electrical Measurement 50%
• Electrostatic Discharge 100%
• Failure Analysis 50%
• VLSI Circuits 100%