Nonlinear Response of ENZ Plasmon Modes near 1550 nm

Cong Liu*, M. Zahirul Alam, Karapet Manukyan, Kai Pang, Yiyu Zhou, Hao Song, Xinzhou Su, Joshua R. Hendrickson, Evan M. Smith, Moshe Tur, Robert W. Boyd, Alan E. Willner

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

We investigate the thickness-and-loss-dependent nonlinear response of ITO-based epsilon-near-zero (ENZ) thin films under different coupling conditions. We find that the surface plasmon modes of the ENZ film can exhibit a nonlinear response at least two orders of magnitude larger than its bulk nonlinear response.

Original languageEnglish
Title of host publication2020 IEEE Photonics Conference, IPC 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728158914
DOIs
StatePublished - Sep 2020
Event2020 IEEE Photonics Conference, IPC 2020 - Virtual, Vancouver, Canada
Duration: 28 Sep 20201 Oct 2020

Publication series

Name2020 IEEE Photonics Conference, IPC 2020 - Proceedings

Conference

Conference2020 IEEE Photonics Conference, IPC 2020
Country/TerritoryCanada
CityVirtual, Vancouver
Period28/09/201/10/20

Keywords

  • (160.4236) nanomaterials
  • (160.4330) Nonlinear optical materials
  • (190.0190) nonlinear optics

Fingerprint

Dive into the research topics of 'Nonlinear Response of ENZ Plasmon Modes near 1550 nm'. Together they form a unique fingerprint.

Cite this