Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy
- X. H. Kong*
- , H. X. Ji
- , R. D. Piner
- , H. F. Li
- , C. W. Magnuson
- , C. Tan
- , A. Ismach
- , H. Chou
- , R. S. Ruoff
*Corresponding author for this work
- University of Texas at Austin
Research output: Contribution to journal › Article › peer-review
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