Nanoscale measurements of electronic properties in organic thin film transistors

Oren Tal*, Yossi Rosenwaks, Yohai Roichman, Nir Tessler, Calvin K. Chan, Antoine Kahn

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Kelvin probe force microscopy was used for extraction of the threshold and the pinch off voltages in organic thin film transistors. The first was determined by direct detection of the charge accumulation onset and the latter by a direct observation of the pinch off region formation. In addition, an effective threshold voltage shift can be extracted from the pinch-off voltage as a function of charge concentration. The dependence of the effective threshold voltage on the gate voltage must be considered when calculating charge carrier concentrations in organic thin film transistors.

Original languageEnglish
Title of host publicationOrganic Thin-Film Electronics
PublisherMaterials Research Society
Pages126-131
Number of pages6
ISBN (Print)155899825X, 9781558998254
DOIs
StatePublished - 2005
Event2005 MRS Spring Meeting - San Francisco, CA, United States
Duration: 28 Mar 20051 Apr 2005

Publication series

NameMaterials Research Society Symposium Proceedings
Volume871
ISSN (Print)0272-9172

Conference

Conference2005 MRS Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA
Period28/03/051/04/05

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