TY - JOUR
T1 - Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy
AU - Ruzin, A.
AU - Croitoru, N.
AU - Lubarsky, G.
AU - Rosenwaks, Y.
PY - 2001/4/1
Y1 - 2001/4/1
N2 - This is a report of preliminary results of Atomic Force Microscopy and Kelvin Probe Force Microscopy measurements performed on high-resistivity silicon particle detectors. All the measured devices were PIN structures. The measurements were performed on cleaved surfaces of non-irradiated as well as irradiated devices. The results indicate that the electric field under the junction contact is non-uniform at thermal equilibrium. The results also show a drastic variation in Contact Potential Difference after irradiation.
AB - This is a report of preliminary results of Atomic Force Microscopy and Kelvin Probe Force Microscopy measurements performed on high-resistivity silicon particle detectors. All the measured devices were PIN structures. The measurements were performed on cleaved surfaces of non-irradiated as well as irradiated devices. The results indicate that the electric field under the junction contact is non-uniform at thermal equilibrium. The results also show a drastic variation in Contact Potential Difference after irradiation.
UR - http://www.scopus.com/inward/record.url?scp=0035303959&partnerID=8YFLogxK
U2 - 10.1016/S0168-9002(00)01216-X
DO - 10.1016/S0168-9002(00)01216-X
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AN - SCOPUS:0035303959
SN - 0168-9002
VL - 461
SP - 229
EP - 232
JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
IS - 1-3
ER -