Multipurpose diffractometer for in situ X-ray crystallography of functional materials

Semën Gorfman*, David Spirito, Netanela Cohen, Peter Siffalovic, Peter Nadazdy, Youli Li

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Laboratory X-ray diffractometers play a crucial role in X-ray crystallography and materials science. Such instruments still vastly outnumber synchrotron facilities and are responsible for most of the X-ray characterization of materials around the world. The efforts to enhance the design and performance of in-house X-ray diffraction instruments benefit a broad research community. Here, the realization of a custom-built multipurpose four-circle diffractometer in the laboratory for X-ray crystallography of functional materials at Tel Aviv University, Israel, is reported. The instrument is equipped with a microfocus Cu-based X-ray source, collimating X-ray optics, four-bounce monochromator, four-circle goniometer, large (PILATUS3 R 1M) pixel area detector, analyser crystal and scintillating counter. It is suitable for a broad range of tasks in X-ray crystallography/structure analysis and materials science. All the relevant X-ray beam parameters (total flux, flux density, beam divergence, monochromaticity) are reported and several applications such as determination of the crystal orientation matrix and high-resolution reciprocal-space mapping are demonstrated. The diffractometer is suitable for measuring X-ray diffraction in situ under an external electric field, as demonstrated by the measurement of electric-field-dependent rocking curves of a quartz single crystal. The diffractometer can be used as an independent research instrument, but also as a training platform and for preparation for synchrotron experiments.

Original languageEnglish
Pages (from-to)914-923
Number of pages10
JournalJournal of Applied Crystallography
StatePublished - 1 Jun 2021


FundersFunder number
Israel Science Foundation2247/18, 1561/18
Tel Aviv University


    • four-circle X-ray diffractometry
    • high-resolution X-ray diffraction
    • monochromators


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