Multiple pulse generator malfunctions with a dual chamber pacemaker

Igor Lipchenca, David Barlev, David Luria, Chava Granit, Zeev Rotshtein, Michael Eldar, Michael Glikson*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The aim of this study was to evaluate the dual chamber uni/bipolar pacemaker Minidual 50, manufactured by SoWn Biomedica. Between 1995 and 1998, 66 Minidual 50 models were implanted at the Heart Institute. During the follow-up period of 33 ± 12.8 months (range 0-50 months), total function loss in seven (10.6%) units and false threshold measurement of sensing and pacing in three (4.5 %) patients were observed. Average time from implantation to malfunction was 37 months (range 28-42). Malfunction was unrelated to battery status and could not be predicted by any measures obtained during the pacemaker follow-up period. Kaplan Meyer survival curve predicted a 70% 4-year malfunction-free survival of that pacemaker model. Given this high rate of total malfunction and the unpredictable nature of its occurrence, the authors recommend the replacement of all remaining Minidual 50 units at risk, at least in dependent patients.

Original languageEnglish
Pages (from-to)936-939
Number of pages4
JournalPACE - Pacing and Clinical Electrophysiology
Volume25
Issue number6
DOIs
StatePublished - 2002

Keywords

  • Follow-up
  • Pacemaker malfunction

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