Multifrequency Near Field Scanning Optical Microscopy (MF-SNOM)

H. Greener, M. Mrejen, U. Arieli, H. Suchowski

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We introduce a novel excitation and detection scheme in near-field optical microscopy based on a multifrequency method. Using this method, we experimentally demonstrate enhanced sensitivity, implying improved spatial resolution in optical measurements.

Original languageEnglish
Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580422
StatePublished - 6 Aug 2018
Event2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States
Duration: 13 May 201818 May 2018

Publication series

Name2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Conference

Conference2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country/TerritoryUnited States
CitySan Jose
Period13/05/1818/05/18

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