Multi-label Classification with Partial Annotations using Class-aware Selective Loss

Emanuel Ben-Baruch, Tal Ridnik, Itamar Friedman, Avi Ben-Cohen, Nadav Zamir, Asaf Noy, Lihi Zelnik-Manor

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Large-scale multi-label classification datasets are commonly, and perhaps inevitably, partially annotated. That is, only a small subset of labels are annotated per sample. Different methods for handling the missing labels induce different properties on the model and impact its accuracy. In this work, we analyze the partial labeling problem, then propose a solution based on two key ideas. First, un-annotated labels should be treated selectively according to two probability quantities: the class distribution in the overall dataset and the specific label likelihood for a given data sample. We propose to estimate the class distribution using a dedicated temporary model, and we show its improved efficiency over a naive estimation computed using the dataset's partial annotations. Second, during the training of the target model, we emphasize the contribution of annotated labels over originally un-annotated labels by using a dedicated asymmetric loss. With our novel approach, we achieve state-of-the-art results on OpenImages dataset (e.g. reaching 87.3 mAP on V6). In addition, experiments conducted on LVIS and simulated-COCO demonstrate the effectiveness of our approach. Code is available at https://github.com/Alibaba-MIIL/PartialLabelingCSL.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PublisherIEEE Computer Society
Pages4754-4762
Number of pages9
ISBN (Electronic)9781665469463
DOIs
StatePublished - 2022
Externally publishedYes
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022 - New Orleans, United States
Duration: 19 Jun 202224 Jun 2022

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2022-June
ISSN (Print)1063-6919

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2224/06/22

Keywords

  • Deep learning architectures and techniques
  • Machine learning
  • Recognition: detection
  • categorization
  • retrieval

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