@article{1f651b42fa924a7b9ea3bd7b4b03a2ed,
title = "Molecule-solid interfaces studied with infrared ellipsometry: Ultrathin nitrobenzene films",
abstract = "This paper aims to demonstrate the high capability of infrared spectroscopic ellipsometry (IRSE) for the characterization of very thin organic films and the organic to inorganic interfaces. It is shown that the detection limit of IRSE facilitates the investigation of ultrathin nitrobenzene (NB) films with monolayer sensitivity. This accounts for substrates from semiconductors to metals. The process of reoxidation of a NB terminated silicon (001) surface is also reflected in the infrared ellipsometric parameters and evidently proceeds despite the organic layer. As a complementary method, x-ray photoelectron spectroscopy (XPS) measurements were performed.",
author = "M. Gensch and K. Roodenko and K. Hinrichs and R. Hunger and G{\"u}ell, {A. G.} and A. Merson and U. Schade and Y. Shapira and Th Dittrich and J. Rappich and N. Esser",
note = "Funding Information: The authors would like to thank Dr. A. R{\"o}seler and Dr. E.H. Korte for many fruitful discussions, Dr. Ch. Pettenkofer of HMI Berlin GmbH for kindly providing access to the XPS apparatus and Professor W. B. Peatman of BESSY GmbH for support of the work at the IRIS beamline. The financial support by the Senatsverwaltung f{\"u}r Wissenschaft, Forschung und Kultur des Landes Berlin and of the Bundesministerium f{\"u}r Bildung and Forschung as well as through BMBF Grant No. 05 KS4KTB3 is gratefully acknowledged. K. Roodenko gratefully acknowledges support from the Minerva foundation.",
year = "2005",
doi = "10.1116/1.1947801",
language = "אנגלית",
volume = "23",
pages = "1838--1842",
journal = "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures",
issn = "1071-1023",
publisher = "AVS Science and Technology Society",
number = "4",
}