Moissanite (SiC) with metal-silicide and silicon inclusions from tuff of Israel: Raman spectroscopy and electron microscope studies

Larissa Dobrzhinetskaya*, Pavel Mukhin, Qin Wang, Richard Wirth, Earl O'Bannon, Wenxia Zhao, Lev Eppelbaum, Tatiana Sokhonchuk

*Corresponding author for this work

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