TY - GEN
T1 - Model variations of Global Lightning Activity Derived from Optical Transient Detector Data
AU - Nickolaenko, A. P.
AU - Pechony, O.
AU - Price, C.
AU - Satori, G.
N1 - Publisher Copyright:
© EMC 2005.All rights reserved.
PY - 2005
Y1 - 2005
N2 - We demonstrate a technique for obtaining model daily variations in the global lightning stroke number based on the maps of spatial distribution of discharges collected by the OTD satellite (Optical Transient Detector) on the annual or monthly span. To obtain the diurnal variations, we apply the masks moving around the globe with the sun. Three masks are used: the dayside of the globe (DS), its afternoon sector (A), and the hot spot, or a circular area of given radius (HS). Each mask ‘activates’ the strokes found within it. We demonstrate that models predict diurnal variations that agree with measurements of fair weather field and intensity of global electromagnetic resonance (Schumann resonance).
AB - We demonstrate a technique for obtaining model daily variations in the global lightning stroke number based on the maps of spatial distribution of discharges collected by the OTD satellite (Optical Transient Detector) on the annual or monthly span. To obtain the diurnal variations, we apply the masks moving around the globe with the sun. Three masks are used: the dayside of the globe (DS), its afternoon sector (A), and the hot spot, or a circular area of given radius (HS). Each mask ‘activates’ the strokes found within it. We demonstrate that models predict diurnal variations that agree with measurements of fair weather field and intensity of global electromagnetic resonance (Schumann resonance).
UR - http://www.scopus.com/inward/record.url?scp=85215659117&partnerID=8YFLogxK
U2 - 10.23919/EMC.2005.10806053
DO - 10.23919/EMC.2005.10806053
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AN - SCOPUS:85215659117
T3 - Proceedings of the 16th International Zurich Symposium on Electromagnetic Compatibility, EMC 2005
SP - 337
EP - 340
BT - Proceedings of the 16th International Zurich Symposium on Electromagnetic Compatibility, EMC 2005
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th International Zurich Symposium on Electromagnetic Compatibility, EMC 2005
Y2 - 13 February 2005 through 18 February 2005
ER -