TY - JOUR
T1 - Maskless Device Fabrication and Laser-Induced Doping in MoS2Field Effect Transistors Using a Thermally Activated Cyclic Polyphthalaldehyde Resist
AU - Kafri, Alonit
AU - Dutta, Debopriya
AU - Mukherjee, Subhrajit
AU - Mohapatra, Pranab K.
AU - Ismach, Ariel
AU - Koren, Elad
N1 - Publisher Copyright:
©
PY - 2021/2/3
Y1 - 2021/2/3
N2 - We present a novel maskless device fabrication technique for rapid prototyping of two-dimensional (2D)-based electronic materials. The technique is based on a thermally activated and self-developed cyclic polyphthalaldehyde (c-PPA) resist using a commercial Raman system and 532 nm laser illumination. Following the successful customization of electrodes to form field effect transistors based on MoS2 monolayers, the laser-induced electronic doping of areas beneath the metal contacts that were exposed during lithography was investigated using both surface potential mapping and device characterization. An effective change in the doping level was introduced depending on the laser intensity, i.e., low laser powers resulted in p-doping, while high laser powers resulted in n-doping. Fabricated devices present a low contact resistance down to 10 kω·μm at a back-gate voltage of VG = 80 V, which is attributed to the laser-induced n-type doping at the metal contact regions.
AB - We present a novel maskless device fabrication technique for rapid prototyping of two-dimensional (2D)-based electronic materials. The technique is based on a thermally activated and self-developed cyclic polyphthalaldehyde (c-PPA) resist using a commercial Raman system and 532 nm laser illumination. Following the successful customization of electrodes to form field effect transistors based on MoS2 monolayers, the laser-induced electronic doping of areas beneath the metal contacts that were exposed during lithography was investigated using both surface potential mapping and device characterization. An effective change in the doping level was introduced depending on the laser intensity, i.e., low laser powers resulted in p-doping, while high laser powers resulted in n-doping. Fabricated devices present a low contact resistance down to 10 kω·μm at a back-gate voltage of VG = 80 V, which is attributed to the laser-induced n-type doping at the metal contact regions.
KW - MoS
KW - PPA
KW - doping
KW - field effect transistor
KW - maskless lithography
UR - http://www.scopus.com/inward/record.url?scp=85100261151&partnerID=8YFLogxK
U2 - 10.1021/acsami.0c19194
DO - 10.1021/acsami.0c19194
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C2 - 33464810
AN - SCOPUS:85100261151
SN - 1944-8244
VL - 13
SP - 5399
EP - 5405
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 4
ER -