TY - GEN
T1 - Mapping structures for flash memories
T2 - IEEE International Conference on Software - Science, Technology and Engineering 2005
AU - Gal, Eran
AU - Toledo, Sivan
PY - 2005
Y1 - 2005
N2 - Flash memory is a type of electrically erasable programmable read-only memory (EEPROM). Because flash memories are nonvolatile and relatively dense, they are now used to store files and other persistent objects in handheld computers, mobile phones, digital cameras, portable music players, and many other computer systems in which magnetic disks are inappropriate. Flash, like earlier EEPROM devices, suffers from two limitations. First, bits can only be cleared by erasing a large block of memory. Second, each block can only sustain a limited number of erasures, after which it can no longer reliably store data. Due to these limitations, sophisticated data structures and algorithms are required to effectively use flash memories. These algorithms and data structures support efficient not-in-place updates of data, reduce the number of erasures, and level the wear of the blocks in the device. This survey presents these algorithms and data structures as well as open theoretical problems that arise in this area.
AB - Flash memory is a type of electrically erasable programmable read-only memory (EEPROM). Because flash memories are nonvolatile and relatively dense, they are now used to store files and other persistent objects in handheld computers, mobile phones, digital cameras, portable music players, and many other computer systems in which magnetic disks are inappropriate. Flash, like earlier EEPROM devices, suffers from two limitations. First, bits can only be cleared by erasing a large block of memory. Second, each block can only sustain a limited number of erasures, after which it can no longer reliably store data. Due to these limitations, sophisticated data structures and algorithms are required to effectively use flash memories. These algorithms and data structures support efficient not-in-place updates of data, reduce the number of erasures, and level the wear of the blocks in the device. This survey presents these algorithms and data structures as well as open theoretical problems that arise in this area.
UR - http://www.scopus.com/inward/record.url?scp=33744478374&partnerID=8YFLogxK
U2 - 10.1109/SWSTE.2005.14
DO - 10.1109/SWSTE.2005.14
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AN - SCOPUS:33744478374
SN - 0769523358
SN - 9780769523354
T3 - Proceedings - IEEE International Conference on Software - Science, Technology and Engineering 2005, SwSTE '05
SP - 83
EP - 92
BT - Proceedings - IEEE International Conference on Software - Science, Technology and Engineering 2005, SwSTE '05
Y2 - 22 February 2005 through 23 February 2005
ER -