Mapping quantitative trait loci associated with grain filling duration and grain number under terminal heat stress in bread wheat (Triticum aestivum L.)

Davinder Sharma, Rajender Singh, Jagadish Rane, Vijay Kumar Gupta, Harohalli Masthigowda Mamrutha, Ratan Tiwari*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Terminal heat stress has the potential negative impact on wheat production across the world, especially in South Asia. Under the threat of terminal heat stress, wheat genotypes with stay green trait would suffer from high temperature stress during their long grain filling duration (GFD). The genotypes with short GFD would be advantageous. To identify quantitative trait loci (QTL) for heat tolerance, a RIL population of K 7903 (heat tolerant) and RAJ 4014 (heat sensitive) wheat genotypes was investigated under timely and late-sown conditions. Heat susceptibility index of GFD, yield components and traits under late-sown condition were used as phenotypic data for QTL identification. Stable QTLs associated with these traits were identified on chromosomes 1B, 2B, 3B, 5A and 6B. The LOD value ranged from 2.9 to 5.0 and the corresponding phenotyping variation explained ranged from 12.0–22%. QTL for heat susceptibility index for the grain filling duration were colocalized with QTL for productive tillers under late sown and GFD under late-sown condition on chromosomes 1B and 5A, respectively. These genomic regions could be exploited for molecular wheat breeding programmes targeting heat tolerance.

Original languageEnglish
Pages (from-to)538-545
Number of pages8
JournalPlant Breeding
Volume135
Issue number5
DOIs
StatePublished - 1 Oct 2016
Externally publishedYes

Keywords

  • QTL
  • grain filling duration
  • grain number
  • terminal heat stress
  • wheat

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