Abstract
Detailed measurements of the transverse magnetoresistance of disordered (Formula presented) thin films were performed above the transition temperature (Formula presented) as a function of temperature and magnetic field. The temperature dependence of the observed magnetoresistance is interpreted in terms of weak localization and superconducting fluctuations. Besides the weak localization, the Aslamazov-Larkin and the Maki-Thompson-Larkin fluctuations processes were included into the fitting procedure. Values of Larkin electron-electron interaction strength parameter (Formula presented) and the total phase-breaking rate (Formula presented) were obtained from the magnetoresistance fits.
Original language | English |
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Pages (from-to) | 4463-4469 |
Number of pages | 7 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 59 |
Issue number | 6 |
DOIs | |
State | Published - 1999 |