Detailed measurements of the transverse magnetoresistance of disordered (Formula presented) thin films were performed above the transition temperature (Formula presented) as a function of temperature and magnetic field. The temperature dependence of the observed magnetoresistance is interpreted in terms of weak localization and superconducting fluctuations. Besides the weak localization, the Aslamazov-Larkin and the Maki-Thompson-Larkin fluctuations processes were included into the fitting procedure. Values of Larkin electron-electron interaction strength parameter (Formula presented) and the total phase-breaking rate (Formula presented) were obtained from the magnetoresistance fits.
|Number of pages
|Physical Review B - Condensed Matter and Materials Physics
|Published - 1999