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Low-temperature film thickness measurements by a quartz thickness monitor
P. H. Barrett
*
,
M. Pasternak
*
Corresponding author for this work
University of California at Santa Barbara
Research output
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Contribution to journal
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Article
›
peer-review
2
Scopus citations
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Keyphrases
Low Temperature
100%
Silica
100%
Thickness Monitor
100%
Film Thickness Measurement
100%
Temperature Range
50%
Resonant Frequency
50%
Temperature Variation
50%
Frequency Shift
50%
Areal Density
50%
Quartz Crystal
50%
Absorption Method
50%
Crystal Thickness
50%
Earth and Planetary Sciences
Methane
100%
Temperature Variation
100%
Quartz Crystal
100%
Film Thickness
100%
Frequency Shift
100%
Physics
Frequency Shift
100%
Film Thickness
100%
Carbon Dioxide
100%
Methane
100%
Quartz Crystal
100%
Engineering
Low-Temperature
100%
Resonance Frequency
50%
Methane
50%
Frequency Shift
50%
Temperature Range
50%
Ray Absorption
50%
Quartz Crystal
50%
Deposited Mass
50%
Agricultural and Biological Sciences
Reproducibility
100%
Methane
100%