TY - JOUR
T1 - Localized rapid heating by low-power solid-state microwave drill
AU - Meir, Yehuda
AU - Jerby, Eli
N1 - Funding Information:
Manuscript received February 13, 2012; revised March 15, 2012; accepted March 19, 2012. Date of publication June 11, 2012; date of current version July 30, 2012. This work was supported by the Israeli Science Foundation under Grant 1270/04 and Grant 1639/11. The authors are with the Faculty of Engineering, Tel-Aviv University, Ramat Aviv 69978, Israel (e-mail: [email protected]). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TMTT.2012.2198233
PY - 2012
Y1 - 2012
N2 - This paper presents a theoretical and experimental study of a locally induced microwave-heating effect implemented by a low-power transistor-based microwave drill. A coupled thermal-electromagnetic model shows that the thermal-runaway instability can be excited also by relatively low microwave power, in the range ∼10-100W, hence by solid-state sources rather than magnetrons. Local melting then occurs in a millimeter scale within seconds in various materials, such as glass, ceramics, basalts, and plastics. The experimental device employs an LDMOS transistor in an oscillator scheme, feeding a miniature microwave-drill applicator. The experimental results verify the rapid heating effect, similarly to the theoretical model. These findings may lead to various material-processing applications of local microwave heating implemented by solid-state devices, including local melting (for surface treatments, chemical reactions, joining, etc.), delicate drilling (e.g., of bones in orthopedic operations), local evaporation, ignition, and plasma ejection (e.g., in microwave-induced breakdown spectroscopy (MIBS) for material identification).
AB - This paper presents a theoretical and experimental study of a locally induced microwave-heating effect implemented by a low-power transistor-based microwave drill. A coupled thermal-electromagnetic model shows that the thermal-runaway instability can be excited also by relatively low microwave power, in the range ∼10-100W, hence by solid-state sources rather than magnetrons. Local melting then occurs in a millimeter scale within seconds in various materials, such as glass, ceramics, basalts, and plastics. The experimental device employs an LDMOS transistor in an oscillator scheme, feeding a miniature microwave-drill applicator. The experimental results verify the rapid heating effect, similarly to the theoretical model. These findings may lead to various material-processing applications of local microwave heating implemented by solid-state devices, including local melting (for surface treatments, chemical reactions, joining, etc.), delicate drilling (e.g., of bones in orthopedic operations), local evaporation, ignition, and plasma ejection (e.g., in microwave-induced breakdown spectroscopy (MIBS) for material identification).
KW - Hotspots
KW - laterally diffused metal-oxide semiconductor field-effect tranLDMOS-FET
KW - microwave drills
KW - microwave heating
KW - thermal-runaway instabilities
UR - http://www.scopus.com/inward/record.url?scp=84864689507&partnerID=8YFLogxK
U2 - 10.1109/TMTT.2012.2198233
DO - 10.1109/TMTT.2012.2198233
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AN - SCOPUS:84864689507
SN - 0018-9480
VL - 60
SP - 2665
EP - 2672
JO - IEEE Transactions on Microwave Theory and Techniques
JF - IEEE Transactions on Microwave Theory and Techniques
IS - 8
M1 - 6214998
ER -