Local oscillations of on-die supply voltage a reliability issue

Moshe Gurfinkel; Pavel Livshits; Anton Rozen; Yefim Fefer; Joseph B. Bernstein; Yoram Shapira

doi:10.1109/TDMR.2009.2025955

Local oscillations of on-die supply voltage a reliability issue

Moshe Gurfinkel^*
, Pavel Livshits
, Anton Rozen
, Yefim Fefer
, Joseph B. Bernstein
, Yoram Shapira

^*Corresponding author for this work

Department of Electrical Engineering - Physical Eng.

Tel Aviv University
Bar-Ilan University
NXP Semiconductors
University of Maryland, College Park

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

On-die measurements of $V-{\rm DD}$ and $V-{\rm SS}$ voltages inside a 90-nm VLSI technology chip are presented. The results show local fluctuations in the $V-{\rm DD}$ and $V-{\rm SS}$ voltages with amplitudes that can reach, in severe cases, more than 10% of $V-{\rm DD}$. These fluctuations can distort analog signals, cause immediate logic faults, and also aggravate other reliability wear-out mechanisms. Both measurements and simulations predict the aggravation of this phenomenon for future technologies.

Original language	English
Article number	5153317
Pages (from-to)	476-482
Number of pages	7
Journal	IEEE Transactions on Device and Materials Reliability
Volume	9
Issue number	3
DOIs	https://doi.org/10.1109/TDMR.2009.2025955
State	Published - Sep 2009

Keywords

Power-distribution network
Reliability
Supply-noise measurement

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10.1109/TDMR.2009.2025955

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title = "Local oscillations of on-die supply voltage a reliability issue",

abstract = "On-die measurements of \$V-\{\textbackslash{}rm DD\}\$ and \$V-\{\textbackslash{}rm SS\}\$ voltages inside a 90-nm VLSI technology chip are presented. The results show local fluctuations in the \$V-\{\textbackslash{}rm DD\}\$ and \$V-\{\textbackslash{}rm SS\}\$ voltages with amplitudes that can reach, in severe cases, more than 10\% of \$V-\{\textbackslash{}rm DD\}\$. These fluctuations can distort analog signals, cause immediate logic faults, and also aggravate other reliability wear-out mechanisms. Both measurements and simulations predict the aggravation of this phenomenon for future technologies.",

keywords = "Power-distribution network, Reliability, Supply-noise measurement",

author = "Moshe Gurfinkel and Pavel Livshits and Anton Rozen and Yefim Fefer and Bernstein, \{Joseph B.\} and Yoram Shapira",

year = "2009",

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doi = "10.1109/TDMR.2009.2025955",

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T1 - Local oscillations of on-die supply voltage a reliability issue

AU - Gurfinkel, Moshe

AU - Livshits, Pavel

AU - Rozen, Anton

AU - Fefer, Yefim

AU - Bernstein, Joseph B.

AU - Shapira, Yoram

PY - 2009/9

Y1 - 2009/9

N2 - On-die measurements of $V-{\rm DD}$ and $V-{\rm SS}$ voltages inside a 90-nm VLSI technology chip are presented. The results show local fluctuations in the $V-{\rm DD}$ and $V-{\rm SS}$ voltages with amplitudes that can reach, in severe cases, more than 10% of $V-{\rm DD}$. These fluctuations can distort analog signals, cause immediate logic faults, and also aggravate other reliability wear-out mechanisms. Both measurements and simulations predict the aggravation of this phenomenon for future technologies.

AB - On-die measurements of $V-{\rm DD}$ and $V-{\rm SS}$ voltages inside a 90-nm VLSI technology chip are presented. The results show local fluctuations in the $V-{\rm DD}$ and $V-{\rm SS}$ voltages with amplitudes that can reach, in severe cases, more than 10% of $V-{\rm DD}$. These fluctuations can distort analog signals, cause immediate logic faults, and also aggravate other reliability wear-out mechanisms. Both measurements and simulations predict the aggravation of this phenomenon for future technologies.

KW - Power-distribution network

KW - Reliability

KW - Supply-noise measurement

UR - https://www.scopus.com/pages/publications/70249144020

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JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

IS - 3

M1 - 5153317

ER -

Local oscillations of on-die supply voltage a reliability issue

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Keywords

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