Local oscillations of on-die supply voltage a reliability issue

Moshe Gurfinkel*, Pavel Livshits, Anton Rozen, Yefim Fefer, Joseph B. Bernstein, Yoram Shapira

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


On-die measurements of $V-{\rm DD}$ and $V-{\rm SS}$ voltages inside a 90-nm VLSI technology chip are presented. The results show local fluctuations in the $V-{\rm DD}$ and $V-{\rm SS}$ voltages with amplitudes that can reach, in severe cases, more than 10% of $V-{\rm DD}$. These fluctuations can distort analog signals, cause immediate logic faults, and also aggravate other reliability wear-out mechanisms. Both measurements and simulations predict the aggravation of this phenomenon for future technologies.

Original languageEnglish
Article number5153317
Pages (from-to)476-482
Number of pages7
JournalIEEE Transactions on Device and Materials Reliability
Issue number3
StatePublished - Sep 2009


  • Power-distribution network
  • Reliability
  • Supply-noise measurement


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