Local measurement of semiconductor band bending and surface charge using Kelvin probe force microscopy

Keyphrases

• Semiconductors 100%
• Band Bending 100%
• Surface Charge 100%
• Scanning Kelvin Probe Force Microscopy (SKPFM) 100%
• Local Measurement 100%
• Electrostatic Interaction 50%
• Charge Density 50%
• P-n Junction 50%
• Elementary Charge 50%
• Surface Band Bending 50%
• Surface Bands 50%
• Three-dimensional Analysis 50%
• Surface Potential Measurement 50%
• Two-dimensional Analysis 50%

Engineering

• Band Bending 100%
• Dimensional Analysis 66%
• Electrostatics 33%
• Two Dimensional 33%
• Charge Density 33%
• Surface Potential 33%
• Elementary Charge 33%

Material Science

• Surface Charge 100%
• Density 50%
• Electrostatic Interaction 50%