Linear test sequences for detecting functionally faulty RAM's

Guy Even; Ophir Rachman; Ilan Spillinger

doi:10.1016/0167-9260(93)90059-L

Linear test sequences for detecting functionally faulty RAM's

Guy Even^*, Ophir Rachman, Ilan Spillinger

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

In this paper we deal with the detection of functional faults in RAM's. We present a fault model which consists of decoder faults and memory array faults. We rectify and extend previous definitions of decoder faults, and we refine previous definitions of two coupling faults. Three test sequences of length 9N, 13N and 17N are presented with proofs of increasing detection capabilities. Our test sequence of length 17N is capable of detecting all combinations of faults in our model.

Original language	English
Pages (from-to)	75-89
Number of pages	15
Journal	Integration, the VLSI Journal
Volume	16
Issue number	1
DOIs	https://doi.org/10.1016/0167-9260(93)90059-L
State	Published - Nov 1993
Externally published	Yes

Keywords

Random access memories (RAM's)
fault detection
fault models
functional faults
test sequences

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10.1016/0167-9260(93)90059-L

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Linear test sequences for detecting functionally faulty RAM's

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Keywords

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