Linear test sequences for detecting functionally faulty RAM's

Guy Even*, Ophir Rachman, Ilan Spillinger

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


In this paper we deal with the detection of functional faults in RAM's. We present a fault model which consists of decoder faults and memory array faults. We rectify and extend previous definitions of decoder faults, and we refine previous definitions of two coupling faults. Three test sequences of length 9N, 13N and 17N are presented with proofs of increasing detection capabilities. Our test sequence of length 17N is capable of detecting all combinations of faults in our model.

Original languageEnglish
Pages (from-to)75-89
Number of pages15
JournalIntegration, the VLSI Journal
Issue number1
StatePublished - Nov 1993
Externally publishedYes


  • Random access memories (RAM's)
  • fault detection
  • fault models
  • functional faults
  • test sequences


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