Learning to sample

Oren Dovrat, Itai Lang, Shai Avidan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

123 Scopus citations

Abstract

Processing large point clouds is a challenging task. Therefore, the data is often sampled to a size that can be processed more easily. The question is how to sample the data? A popular sampling technique is Farthest Point Sampling (FPS). However, FPS is agnostic to a downstream application (classification, retrieval, etc.). The underlying assumption seems to be that minimizing the farthest point distance, as done by FPS, is a good proxy to other objective functions. We show that it is better to learn how to sample. To do that, we propose a deep network to simplify 3D point clouds. The network, termed S-NET, takes a point cloud and produces a smaller point cloud that is optimized for a particular task. The simplified point cloud is not guaranteed to be a subset of the original point cloud. Therefore, we match it to a subset of the original points in a post-processing step. We contrast our approach with FPS by experimenting on two standard data sets and show significantly better results for a variety of applications. Our code is publicly available.

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019
PublisherIEEE Computer Society
Pages2755-2764
Number of pages10
ISBN (Electronic)9781728132938
DOIs
StatePublished - Jun 2019
Event32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019 - Long Beach, United States
Duration: 16 Jun 201920 Jun 2019

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2019-June
ISSN (Print)1063-6919

Conference

Conference32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019
Country/TerritoryUnited States
CityLong Beach
Period16/06/1920/06/19

Funding

FundersFunder number
Israel Science Foundation1917/15

    Keywords

    • Deep Learning

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