Laser surface photovoltage spectroscopy: A new tool for the determination of surface state distributions

L. Kronik; L. Burstein; Yoram Shapira; M. Oron

doi:10.1063/1.109751

Laser surface photovoltage spectroscopy: A new tool for the determination of surface state distributions

L. Kronik^*, L. Burstein, Yoram Shapira, M. Oron

^*Corresponding author for this work

Department of Electrical Engineering - Physical Eng.

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

A new experimental technique, which utilizes a tunable laser as the illumination source for surface photovoltage spectroscopy measurements, is presented. The data obtained by this technique make it possible to determine the distribution function of gap states observed at semiconductor interfaces. An outline of the approach together with experimental results obtained using a Ti:sapphire laser on InAlAs and CdTe crystals is given.

Original language	English
Pages (from-to)	60-62
Number of pages	3
Journal	Applied Physics Letters
Volume	63
Issue number	1
DOIs	https://doi.org/10.1063/1.109751
State	Published - 1993

Access to Document

10.1063/1.109751

Cite this

@article{eab54ec30b89462787c5c43aeefdc3c5,

title = "Laser surface photovoltage spectroscopy: A new tool for the determination of surface state distributions",

abstract = "A new experimental technique, which utilizes a tunable laser as the illumination source for surface photovoltage spectroscopy measurements, is presented. The data obtained by this technique make it possible to determine the distribution function of gap states observed at semiconductor interfaces. An outline of the approach together with experimental results obtained using a Ti:sapphire laser on InAlAs and CdTe crystals is given.",

author = "L. Kronik and L. Burstein and Yoram Shapira and M. Oron",

year = "1993",

doi = "10.1063/1.109751",

language = "אנגלית",

volume = "63",

pages = "60--62",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "1",

}

TY - JOUR

T1 - Laser surface photovoltage spectroscopy

T2 - A new tool for the determination of surface state distributions

AU - Kronik, L.

AU - Burstein, L.

AU - Shapira, Yoram

AU - Oron, M.

PY - 1993

Y1 - 1993

N2 - A new experimental technique, which utilizes a tunable laser as the illumination source for surface photovoltage spectroscopy measurements, is presented. The data obtained by this technique make it possible to determine the distribution function of gap states observed at semiconductor interfaces. An outline of the approach together with experimental results obtained using a Ti:sapphire laser on InAlAs and CdTe crystals is given.

AB - A new experimental technique, which utilizes a tunable laser as the illumination source for surface photovoltage spectroscopy measurements, is presented. The data obtained by this technique make it possible to determine the distribution function of gap states observed at semiconductor interfaces. An outline of the approach together with experimental results obtained using a Ti:sapphire laser on InAlAs and CdTe crystals is given.

UR - http://www.scopus.com/inward/record.url?scp=0004994744&partnerID=8YFLogxK

U2 - 10.1063/1.109751

DO - 10.1063/1.109751

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:0004994744

SN - 0003-6951

VL - 63

SP - 60

EP - 62

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 1

ER -

Laser surface photovoltage spectroscopy: A new tool for the determination of surface state distributions

Abstract

Access to Document

Other files and links

Fingerprint

Cite this